Amptek XRS-FP2 Quantitative XRF Analysis Software

Description

XRS-FP2 is the next generation quantitative analysis software package for materials analysis using X-Ray Fluorescence (XRF). The single, integrated software package can be used in 3 different modes for different applications: – Single-layer samples, for compositional and single-layer thickness analysis (XRS-FP2 BULK) – Multi-layer, thin-film samples, for composition and multilayer thickness analysis (XRS-FP2 MTF) – Single-layer samples, for composition and single-layer thickness using an incident electron beam instead of and x-ray beam (XRS-FP2 EPXA)